[SFDXA] Fwd: Register Now! Electrically Small Antennas - Reliable Design and Verification

[Kai]

I think that this is a free seminar.
Cheers
Kai, KE4PT


-------- Forwarded Message --------
Subject: 	Register Now! Electrically Small Antennas - Reliable Design and 
Verification
Date: 	Thu, 18 Oct 2018 08:01:17 -0600
From: 	IEEE Spectrum Tech Insider <reply at media.ieee.org>
Reply-To: 	IEEE 
<reply-fe611c737260077d7115-72896839_HTML-2038073685-10754628-0 at media.ieee.org>
To: 	k.siwiak at ieee.org



IEEE Spectrum: Tech Insiders Webinar Series
View online 
<http://view.media.ieee.org/?qs=afde5029a511e139eed37e4f2bb142c2c029598e25c4053b5b99cc4075c13d595fd3a694aa7698fcb132debcbe9af52b25f960f82108e73878c7c17768bc1cb57086492baa59e940eb749c871e951de42e7b76518919ed3e> 

IEEE Spectrum 	

	Thurs, 25 Oct 2018

11:00 EDT / 8:00 PDT / 17:00 CEST / 22:00 ICT 	


  Electrically Small Antennas — Reliable Design and Verification

Register Here 
<http://click.media.ieee.org/?qs=6618102130397cbce2dc3060943af7b7cc18cf4fcafe5bf8f5d21cbe9039afc8b328ef83a7fc06360af4f9551b897e050c58b5418641844e> 


(Duration: 60 minutes)


    DETAILS

This eSeminar will present the design workflow for electrically small antennas, 
with a focus on the reliability of the design procedure. Typical design 
workflows using measurement by semi-rigid cables often lead to an unreliable 
design. We will investigate the sources of this unreliability and then present 
the modified design workflow which uses both simulation in CST Studio Suite® and 
measurements.

Sponsored By

	

Jan Eichler

/Solution Consultant Specialist — SIMULIA/
Jan Eichler is a SIMULIA Solution Consultant Specialist and received his M.Sc. 
and Ph.D. in radioelectronics from the Czech Technical University in Prague in 
2010 and 2014 respectively. His research was focused on antenna modal 
decomposition and integral equations in electromagnetics. Eichler's main area of 
work involves high frequency applications and EMC/EMI simulation. Eichler also 
works on development of techniques to characterize material properties from 
measured data.

Register Here 
<http://click.media.ieee.org/?qs=6618102130397cbce2dc3060943af7b7cc18cf4fcafe5bf8f5d21cbe9039afc8b328ef83a7fc06360af4f9551b897e050c58b5418641844e> 


*NOTE:* The content of this webinar is brought to you by our sponsor. By 
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share your contact information with the sponsor of this webinar.

For webinar queries email GS-WebinarTeam at ieeeglobalspec.com 
<mailto:GS-WebinarTeam at ieeeglobalspec.com?subject=Re:%20IEEE%20Spectrum%20Tech%20Insiders%20Webinar%20Series> 



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